Line-field white light interferometry using tunable-path-difference source

Jaeheung Kim; Nguyen Thanh Phong Truong; Junghwan Oh; Chang-Seok Kim

doi:10.1364/ISA.2022.ITh4D.2

Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP)
Technical Digest Series (Optica Publishing Group, 2022),
paper ITh4D.2
•https://doi.org/10.1364/ISA.2022.ITh4D.2

Line-field white light interferometry using tunable-path-difference source

Jaeheung Kim, Nguyen Thanh Phong Truong, Junghwan Oh, and Chang-Seok Kim

Imaging Systems and Applications 2022

Vancouver, British Columbia Canada
11–15 July 2022
ISBN: 978-1-957171-09-8

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Practical Optical Devices: OCT, Endoscopy, LIDAR II (ITh4D)

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J. Kim, N. T. P. Truong, J. Oh, and C. Kim, "Line-field white light interferometry using tunable-path-difference source," in Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP), Technical Digest Series (Optica Publishing Group, 2022), paper ITh4D.2.

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Abstract

We propose line-field white light interferometry using a tunable-path-difference source, improving imaging performance. By simultaneously acquiring signals along the line, the system has higher imaging speed and stability for a wide field of view imaging.

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