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A New High Resolution Time-of-Flight Mass Spectrometer with UV Laser-Induced surface Ionization

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Abstract

UV laser-induced surface ionization with prism internal reflection is demonstrated to be a useful ion source for the Time-of-Flight mass spectrometer (TOF-MS). Spraying aniline (93 amn) on the prism surface and using 2 ns UV laser pulses, mass resolutions of 3900 and 11000 have been achieved in a linear TOF-MS and a reflectron TOF-MS, respectively. Theoretical calculations indicate that mass resolution of over one million is possible, if a picosecond laser and appropriate electronics are employed.

© 1987 Optical Society of America

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