Trace Analysis of Solids Using Multiphoton Resonance Ionization

D. Pappas; D. Hrubowchok; L. Mitchell; N. Winograd

doi:10.1364/LACA.1987.PDP20

Topical Meeting on Laser Applications to Chemical Analysis
Technical Digest Series (Optica Publishing Group, 1987),
paper PDP20
•https://doi.org/10.1364/LACA.1987.PDP20

Trace Analysis of Solids Using Multiphoton Resonance Ionization

D. Pappas, D. Hrubowchok, L. Mitchell, and N. Winograd

Laser Applications to Chemical Analysis 1987

Incline Village, Nevada United States
26–29 January 1987
ISBN:

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Postdeadline Paper (PDP)

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D. Pappas, D. Hrubowchok, L. Mitchell, and N. Winograd, "Trace Analysis of Solids Using Multiphoton Resonance Ionization," in Topical Meeting on Laser Applications to Chemical Analysis, Technical Digest Series (Optica Publishing Group, 1987), paper PDP20.

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Abstract

Energetic ion bombardment has been coupled with Multiphoton Resonance Ionization Spectroscopy to yield a powerful tool for surface analysis. This technique will be used to search for and examine he double-beta decay of Xe to Ba.

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