Digital Automated Visual Inspection with Darkfield Microscopy

Jorge L.C. Sanz; Fritz Merkle; Kwan Y. Wong

doi:10.1364/MV.1985.ThA3

Topical Meeting on Machine Vision
Technical Digest Series (Optica Publishing Group, 1985),
paper ThA3
•https://doi.org/10.1364/MV.1985.ThA3

Digital Automated Visual Inspection with Darkfield Microscopy

Jorge L.C. Sanz, Fritz Merkle, and Kwan Y. Wong

Machine Vision 1985

Incline Village, Nevada United States
20–22 March 1985
ISBN:

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Sensing Systems I (ThA)

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J. L. C. Sanz, F. Merkle, and K. Y. Wong, "Digital Automated Visual Inspection with Darkfield Microscopy," in Topical Meeting on Machine Vision, Technical Digest Series (Optica Publishing Group, 1985), paper ThA3.

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Abstract

Current research interests in the area of visual inspection include the design of new sensing technologies, high speed digital image processing techniques for scene analysis and efficient architectures for real-time implementation of the inspection tasks.

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