Abstract

Measurements of the reflection and transmission in the mid-infrared of varying thicknesses (5400 Å) of platinum silicide films on silicon substrates are presented. The data are used to calculate the absorption and optical constants (n,k) of the thin films; the optical constants are then used to determine the structure of the optical cavity required to optimize the absorption of the metal film. Finally, a model for internal photoemission is combined with the calculated absorption measurements and the structure is reoptimized to determine the cavity structure required for greatest photoyield.

© 1985 Optical Society of America