Abstract

We discuss how to optically characterize a positive uniaxial crystal using a novel ellipsometric technique.¹ We detect the largest angle of incidence at which a linearly polarized laser beam is reflected linearly polarized. The ellipsometer is composed of only a polarizer and an analyzer. At the detected angle of incidence we measure the s reflectance, perpendicular to the plane of incidence. Using the measured angle of incidence and reflectance we determine the ordinary (N_o) and extraordinary (N_e) refractive indices using very simple expressions. We conclude with an error analysis showing the very high accuracy of the method.

© 1985 Optical Society of America