Abstract

Several techniques have recently been developed for imaging 1-D and 2-D dielectric objects using frequency domain scattering data. Here we examine these techiques which include both perturbational schemes and exact reconstructions. For 1-D configurations we use a recently derived integral equation by Balanis and a nonlinear renormalization technique developed by us to reconstruct lossless dielectric profiles. The methods are validated by an experiment using a swept frequency microwave source and by simulation. These techniques appear robust with respect to imprecise data. For 2-D configurations, Fourier transform and backprojection methods are used to implement linear, perturbational methods of reconstruction. Again, swept frequency microwave measurements and simulations are used to validate the results for multiply connected dielectric objects. More exact schemes are now under consideration for the higher dimensional case.

© 1985 Optical Society of America