Abstract

In conventional triangulation systems for 3-D sensing there is a trade-off between range of depth and resolution. We proposed a triangulation system with a large depth of field (1 m or more) and at the same time high resolution (20 μm or better). The system is essentially based on an arrangement of axicons in the illumination device and on the use of the Scheimpflug condition in the observation device. A suitable scanning-by-deflection geometry is described.

© 1985 Optical Society of America