Abstract

Asymmetry in thin-film microstructure leads to a variety of anisotropic effects. The waveguiding method yields polarization-dependent refractive indices for thin films deposited at normal incidence. However, anisotropic effects are very much more pronounced in films deposited (intentionally or unintentionally) at oblique angles. For these films, anisotropic effects can be observed with light at normal incidence. Some of these effects are influenced or are caused by adsorbed moisture. Thus, form birefringence reduces with moisture uptake, the speed of lateral water penetration is greatest perpendicular to the deposition plane, and the angular spread of light scattered by water patches is largest in the deposition plane.

© 1986 Optical Society of America