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Phase conjugate resonator for high-resolution scanning microscopy

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Abstract

Previous research has shown that the resolution of an image can be increased by passing the illumination beam through the object more than once.1 This requires the use of a critically aligned mirror to reflect the wave back through the object. We analyze the effects of using a phase conjugate mirror to perform the reflection. Three advantages accrue: (1) the alignment is no longer critical; (2) the reflection does not invert the distribution that illuminates the object; and (3) more than two passes through the object can be obtained. We present descriptions of several implementations and the analyses of their operation.

© 1986 Optical Society of America

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