Abstract

Experimental techniques for determining Mueller matrices as a function of wavelength are described. The properties of Mueller matrices are briefly described. Techniques of measuring Mueller matrices described by Azzam¹ and Bickel and Bailey² are used to determine completely the polarizing properties of a sample as a function of wavelength in a modified Fourier transform infrared spectrometer (FTIR). Implications of the instrumental polarization of the FTIR and the dependence on wavelength of the properties of the optical elements are discussed, in particular, the variation of retardance of the quarter waveplates and the variation of the diattenuation of the polarizers.

© 1988 Optical Society of America