Abstract

In remote sensing both a frequency scanned interferometer and a (mode-locked) short-pulse laser provide the capability for measuring the profile of an object. We present a comparative analysis for these systems. Consistency in the notation is important since both temporal and spatial domain equations are used. For the short pulse system the form of the equation for the time varying analytic signal of the scattered field is shown to be a convolution in time of the original pulse shape with the density function of the surface of the object. Thus the spatial features of the surface of the object are evident in this expression. With the frequency scanned system the envelope of the monochromatic field scattered from the object is expressed in terms of the illuminating frequency. Assuming a continuum of illuminating frequencies, we Fourier transform this envelope function with respect to frequency to obtain the de sired result for the processed echo in a time domain. Both equations give remarkably consistent results, each with identical dependence on time and object profile.

© 1989 Optical Society of America