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Dead-time effects in curved-channel microchannel plates

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Abstract

Dead-time effects of microchannel plates (MCPs) are due to the recharging time of the semiconducting inner wall of individual microchannels. To study the dependence of dead-time effects on the area of illumination, circular apertures of different size are imaged onto the curved-channel microchannel plate (C-MCP) using ultraviolet light (257.3 nm). It is found that an independent paralyzable counter (IPC) model, which assumes that individual microchannels of the C-MCP behave as independent paralyzable counters with a fixed dead time, agrees well with experimental results. Except for the case of a small illuminated area, the variance data as well as the mean agree well with theoretical predictions up to a certain level of illumination. However, above this level of illumination the response of C-MCP becomes highly saturated and the IPC model no longer gives good predictions. From this investigation we may conclude that the apparent coupling between microchannels observed in previous investigations1 is largely due to the complex structure of the MCP assembly, at least in the operational sense, rather than due to the intrinsic property of the MCP.

© 1989 Optical Society of America

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