Abstract

The current trend in integrated optics and optoelectronics is toward more complicated structures. Multilayer structures are used to satisfy a number of requirements that often compete with one another, making it difficult to design the best device without the aid of an optimization routine. Optimization requires that the complex propagation constants for a particular structure be found without user input. This is accomplished by using an adapted version of the Lorentzian function generation as found in Ramadas et al.¹ This method is valid for finding both bound and leaky modes of an arbitrary, multilayer structure. The optical-field profiles are calculated by using the thin-film field-transfer matrix theory for planar, multilayer waveguides. The Nelder–Mead simplex method is then employed to find the optimum solution as defined by the device-dependent merit function. Degrees of freedom include layer thicknesses, index of the layers, and layer placement. The results of a program that can quickly find the optimum solution to formidable, analytical design problems will be presented.

© 1990 Optical Society of America