Response-profile-based curvature measurement

Jaeyoung Rhi; Deborah Walters

doi:10.1364/OAM.1990.MQQ6

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Conferences > OAM > 1990 > MQQ > MQQ6

Optical Society of America Annual Meeting
Technical Digest Series (Optica Publishing Group, 1990),
paper MQQ6
•https://doi.org/10.1364/OAM.1990.MQQ6

Response-profile-based curvature measurement

Jaeyoung Rhi and Deborah Walters

Author Information

Author Affiliations

Jaeyoung Rhi and Deborah Walters

State University of New York, New York, New York

Find other works by these authors

J Rhi
D Walters

OSA Annual Meeting 1990

Boston, Massachusetts United States
4–9 November 1990
ISBN:

From the session
Recognition of Complex Objects: 2 (MQQ)

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J. Rhi and D. Walters, "Response-profile-based curvature measurement," in Optical Society of America Annual Meeting, Technical Digest Series (Optica Publishing Group, 1990), paper MQQ6.

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Related Topics
Optics & Photonics Topics
?

The topics in this list come from the Optics and Photonics Topics applied to this article.
- Curvature

Abstract

Abstract

We present new local algorithms for curvature detection on the basis of the finding that the response profiles of oriented operators contain amplitude, orientation, and curvature information.

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OSA Annual Meeting 1990
Boston, Massachusetts United States
4–9 November 1990
ISBN:
From the session Recognition of Complex Objects: 2 (MQQ)

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