Investigation of the diffusion processes during the waveguide fabrication by ion exchange in glass

K. H. Giebler; F. Rauch; W. Wagner; C. Singer; C. Singer; N. Fabricius; N. Fabricius

doi:10.1364/OAM.1990.MZ4

Optical Society of America Annual Meeting
Technical Digest Series (Optica Publishing Group, 1990),
paper MZ4
•https://doi.org/10.1364/OAM.1990.MZ4

Investigation of the diffusion processes during the waveguide fabrication by ion exchange in glass

K. H. Giebler, F. Rauch, W. Wagner, C. Singer, and N. Fabricius

OSA Annual Meeting 1990

Boston, Massachusetts United States
4–9 November 1990
ISBN:

From the session
Glass Integrated Optics: 3 (MZ)

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K. H. Giebler, F. Rauch, W. Wagner, C. Singer, and N. Fabricius, "Investigation of the diffusion processes during the waveguide fabrication by ion exchange in glass," in Optical Society of America Annual Meeting, Technical Digest Series (Optica Publishing Group, 1990), paper MZ4.

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Abstract

For exact modeling of integrated-optical devices by the beam-propagation method, for example, an accurate knowledge of the refractive index profile is necessary. Especially in the case of single-mode waveguides, optical measuring methods fail because their spatial resolution is too low.

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