Abstract

When the thickness of a specimen is greater than the depth of field (DOF) of a microscope, the observed image is obscured because parts of the specimen are in focus while other parts are out of focus. These out-of-focus obscurities can be partially removed by iterative algorithms involving three dimensional data sets. However, there are practical limitations in doing so; a full three-dimensional image restoration will require both large memory storage and a long processing time.

© 1990 Optical Society of America