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Theory of Ultrafast Nonlinear Refraction in Semiconductor Lasers

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Abstract

Recent observations of a large and ultrafast (<100 fs) nonlinear refraction in semiconductor lasers near their transparency edge has generated much interest owing to their potential use for all optical switching.[1,2] The mechanisms responsible for such nonlinearities have been partially attributed to virtual interband transitions (AC Stark effect). We have extended an earlier model [3] which successfully described the dispersion and band-gap scaling of the electronic n2 in passive semiconductors in their transparency range (hω<Eg) to explain such nonlinearities in semiconductor amplifiers at photon energies near the transparency point (hω>Eg). This simple model uses a nonlinear Kramers-Kronig transformation to obtain n2 from a nondegenerate absorption spectrum as calculated using a "dressed state" formalism accounting for the effects of two-photon absorption, electronic Raman, and the optical Stark shift of the bands. In extending this model to active semiconductors, it is essential to include the Fermi-Dirac (FD) distribution with quasi-Fermi levels and T2 broadening of these levels. In addition, assuming that upon Stark shifting the bands, the FD distribution re-establishes in a time τe-e ≅ 10-14 sec shorter than the pulsewith, an enhancement of n2 at the transparency point is predicted. Fig.1 depicts the calculated values of n2 for AlGaAs (Eg ≅ 1.5 eV) as a function of the photon energy for various quasi-Fermi levels. It is seen that n2 reaches a maximum negative value near the transparency point of each curve. Semiconductors with smaller band-gaps will exhibit a larger nonlinearity since n2 scales as Eg-4 as in the case of a passive medium.[3] The sign and magnitude of n2, as predicted by this theory, is in good agreement with the experimentally reported values in AlGaAs [1] and InGaAsP [2] diode lasers.

© 1991 Optical Society of America

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