Phase unwrapping using a sequentially updated cellular processor

M. Servin; R. Rodriguez-Vera; D. Malacara

doi:10.1364/OAM.1993.ThE.2

OSA Annual Meeting
Technical Digest Series (Optica Publishing Group, 1993),
paper ThE.2
•https://doi.org/10.1364/OAM.1993.ThE.2

Phase unwrapping using a sequentially updated cellular processor

M. Servin, R. Rodriguez-Vera, and D. Malacara

OSA Annual Meeting 1993

Toronto Canada
3–8 October 1993
ISBN:

From the session
Symposium on Tolerances and Measurement of Wave-Front Errors (ThE)

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M. Servin, R. Rodriguez-Vera, and D. Malacara, "Phase unwrapping using a sequentially updated cellular processor," in OSA Annual Meeting, Technical Digest Series (Optica Publishing Group, 1993), paper ThE.2.

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Abstract

Fringe analysis is the backbone procedure in many techniques of Optical metrology. These optical metrologies may range from testing image formation optical systems, to electronic speckle metrology.

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