Oversampling digital phase metrology for shot-limited interferometry

Lawrence N. Mertz; Geert Wyntjes

doi:10.1364/OAM.1993.ThE.7

OSA Annual Meeting
Technical Digest Series (Optica Publishing Group, 1993),
paper ThE.7
•https://doi.org/10.1364/OAM.1993.ThE.7

Oversampling digital phase metrology for shot-limited interferometry

Lawrence N. Mertz and Geert Wyntjes

OSA Annual Meeting 1993

Toronto Canada
3–8 October 1993
ISBN:

From the session
Symposium on Tolerances and Measurement of Wave-Front Errors (ThE)

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L. N. Mertz and G. Wyntjes, "Oversampling digital phase metrology for shot-limited interferometry," in OSA Annual Meeting, Technical Digest Series (Optica Publishing Group, 1993), paper ThE.7.

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Abstract

Oversampling with ordered dither can favorably change the noise versus bandwidth tradeoff relation of interferometric measurement. As a result, phase quantization errors may be reduced to less than shot noise for almost any laser power.

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