Material-flaw detection and classification using optical interferometry, the Fourier transform, and an artificial neural network

Tin M. Aye; Araz Yacoubian; Dai-Hyun Kim; Tomasz Jannson

doi:10.1364/OAM.1993.ThI.3

OSA Annual Meeting
Technical Digest Series (Optica Publishing Group, 1993),
paper ThI.3
•https://doi.org/10.1364/OAM.1993.ThI.3

Material-flaw detection and classification using optical interferometry, the Fourier transform, and an artificial neural network

Tin M. Aye, Araz Yacoubian, Dai-Hyun Kim, and Tomasz Jannson

OSA Annual Meeting 1993

Toronto Canada
3–8 October 1993
ISBN:

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Pattern Recognition: 1 (ThI)

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T. M. Aye, A. Yacoubian, D. Kim, and T. Jannson, "Material-flaw detection and classification using optical interferometry, the Fourier transform, and an artificial neural network," in OSA Annual Meeting, Technical Digest Series (Optica Publishing Group, 1993), paper ThI.3.

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Abstract

Automatic detection and classification of material flaws based on real-time holographic interferometry, optical Fourier transform and an electronic neural network approach is reported.

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