Vacuum-Deposited Thin-Film Interferometers as Bistable Devices Operating Continuously at Room Temperature

S.P. Apanasevich; F.V. Karpushko; G.V. Sinitsyn

doi:10.1364/OBI.1983.FB4

Topical Meeting on Optical Bistability
Technical Digest Series (Optica Publishing Group, 1983),
paper FB4
•https://doi.org/10.1364/OBI.1983.FB4

Vacuum-Deposited Thin-Film Interferometers as Bistable Devices Operating Continuously at Room Temperature

S.P. Apanasevich, F.V. Karpushko, and G.V. Sinitsyn

Optical Bistability 1983

Rochester, New York United States
15–17 June 1983
ISBN:

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CDS and Thin Film Bistability (FB)

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S. P. Apanasevich, F. V. Karpushko, and G. V. Sinitsyn, "Vacuum-Deposited Thin-Film Interferometers as Bistable Devices Operating Continuously at Room Temperature," in Topical Meeting on Optical Bistability, Technical Digest Series (Optica Publishing Group, 1983), paper FB4.

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Abstract

Bistable operation of a nonlinear thin-film semiconductor interferometer, fabricated by vacuum deposition, was first observed in [1]. Refractive index nonlinearity required was achieved in a ZnS-spacer of submicron thickness with the input light beam intensity of about 6 kW/cm².

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