Characterization of Birefringence of Optical Disk Substrates Using a Novel Ellipsometric Approach

Hong Fu; S. Sugaya; S. Sugaya; J.K. Erwin; M. Mansuripur

doi:10.1364/ODS.1994.MC4

Optical Data Storage
Technical Digest Series (Optica Publishing Group, 1994),
paper MC4
•https://doi.org/10.1364/ODS.1994.MC4

Characterization of Birefringence of Optical Disk Substrates Using a Novel Ellipsometric Approach

Hong Fu, S. Sugaya, J.K. Erwin, and M. Mansuripur

Optical Data Storage 1994

Dana Point, California United States
16–18 May 1994
ISBN:

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H. Fu, S. Sugaya, J. K. Erwin, and M. Mansuripur, "Characterization of Birefringence of Optical Disk Substrates Using a Novel Ellipsometric Approach," in Optical Data Storage, Technical Digest Series (Optica Publishing Group, 1994), paper MC4.

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Abstract

The birefringence of polycarbonate optical disk substrates is of great concern because of its negative effects on the performance of optical data storage systems. In this presentation we describe our results in characterization of birefringence using ellipsometry.

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