The Coaxial Equal Path Interferometer

Joseph A. Magner; Joann B. Horwitz

doi:10.1364/OFT.1980.MB1

Workshop on Optical Fabrication and Testing
Technical Digest Series (Optica Publishing Group, 1980),
paper MB1
•https://doi.org/10.1364/OFT.1980.MB1

The Coaxial Equal Path Interferometer

Joseph A. Magner and Joann B. Horwitz

Optical Fabrication and Testing 1980

Oakland, California United States
4–6 June 1980
ISBN:

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Special Fabrication and Testing Techniques (MB)

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J. A. Magner and J. B. Horwitz, "The Coaxial Equal Path Interferometer," in Workshop on Optical Fabrication and Testing, Technical Digest Series (Optica Publishing Group, 1980), paper MB1.

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Abstract

A new form of Equal Path Interferometer (EPI) will be described. As opposed to the usual form of EPI, the Coaxial Equal Path Interferometer (CPI) is designed to work on axis and is confocal. These factors, along with the other advantages of EPI's make the CPI very well suited for many difficult test situations. The advantages and adaptability of the CPI will be discussed. The performance characteristics will be presented along with some examples of interferograms obtained with the CPI.

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