Moire Deflectometry Utilizing "ZYGO" Automatic Pattern Processor System

D.K. Sharma; C. Delisle

doi:10.1364/OFT.1986.ThA6

Workshop on Optical Fabrication and Testing
(Optica Publishing Group, 1986),
paper ThA6
•https://doi.org/10.1364/OFT.1986.ThA6

Moire Deflectometry Utilizing "ZYGO" Automatic Pattern Processor System

D.K. Sharma and C. Delisle

Optical Fabrication and Testing 1986

Seattle, Washington United States
21–23 October 1986
ISBN:

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Session 3 (ThA)

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D. K. Sharma and C. Delisle, "Moire Deflectometry Utilizing "ZYGO" Automatic Pattern Processor System," in Workshop on Optical Fabrication and Testing, (Optica Publishing Group, 1986), paper ThA6.

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Abstract

Moire deflectometry^1,2 provides a viable alternative to interferometry for the measurement of ray deflections from a phase object. Being an incoherent technique it is free from stability problems associated with interferometry. Among the other advantages is the simplicity of the setup and use of low quality optics.

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