Sub-Nyquist Interferometry -- Review and Status

J. E. Greivenkamp

doi:10.1364/OFT.1987.ThAA2

Workshop on Optical Fabrication and Testing
Technical Digest Series (Optica Publishing Group, 1987),
paper ThAA2
•https://doi.org/10.1364/OFT.1987.ThAA2

Sub-Nyquist Interferometry -- Review and Status

J. E. Greivenkamp

Optical Fabrication and Testing 1987

Rochester, New York United States
20–23 October 1987
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Metrology: 1 (ThAA)

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J. E. Greivenkamp, "Sub-Nyquist Interferometry -- Review and Status," in Workshop on Optical Fabrication and Testing, Technical Digest Series (Optica Publishing Group, 1987), paper ThAA2.

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Abstract

Sub-Nyquist interferometry (SNI) is a new method of data analysis for phase-shifting interferometry (PSI) that greatly extends the measurement range of an interferometer for a given amount of data.¹ This paper reviews the concept and principles of SNI, and details the progress towards a practical implementation of the technique.

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