Limitations of Spatial Phase-Measurement Techniques

Katherine Creath; Joanna Schmit

doi:10.1364/OFT.1992.WA5

Optical Fabrication and Testing Workshop
Technical Digest Series (Optica Publishing Group, 1992),
paper WA5
•https://doi.org/10.1364/OFT.1992.WA5

Limitations of Spatial Phase-Measurement Techniques

Katherine Creath and Joanna Schmit

Optical Fabrication and Testing 1992

Boston, Massachusetts United States
17–19 November 1992
ISBN:

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Metrology (WA)

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K. Creath and J. Schmit, "Limitations of Spatial Phase-Measurement Techniques," in Optical Fabrication and Testing Workshop, Technical Digest Series (Optica Publishing Group, 1992), paper WA5.

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Abstract

Spatial phase-measurement (SPM) interferometry techniques are affected by a number of limitations. These include the wrong carrier frequency and detector nonlinearities in N-point spatial techniques, and leakage in the Fourier-transform method. Computer simulations in one dimension with straight, equally-spaced fringes reveal the character and magnitude of these errors.

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