Assessment of sub-micron subsurface damage in glass

Jing Xu; Gong Chen; Jie Qiao; John C. Lambropoulos

Optica Design and Fabrication Congress 2023 (IODC, OFT)
Technical Digest Series (Optica Publishing Group, 2023),
paper OTh1B.2

Assessment of sub-micron subsurface damage in glass

Jing Xu, Gong Chen, Jie Qiao, and John C. Lambropoulos

Optical Fabrication and Testing 2023

Québec City, Québec Canada
4–8 June 2023
ISBN: 978-1-957171-22-7

From the session
Manufacturing Considerations (OTh1B)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
J. Xu, G. Chen, J. Qiao, and J. C. Lambropoulos, "Assessment of sub-micron subsurface damage in glass," in Optica Design and Fabrication Congress 2023 (IODC, OFT), Technical Digest Series (Optica Publishing Group, 2023), paper OTh1B.2.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Save article

Abstract

We present a new experimental method for assessing sub-micron level subsurface damage (SSD) on fine ground and fs-laser polished optical glass. Our results demonstrate that fs-laser can polish glass surface without inducing SSD.

PDF Article

More Like This

Subsurface Damage (SSD) Assessment in Ground Silicon Carbide (SiC)

John C. Lambropoulos, Sivan Salzman, Thomas R. Smith, Jing Xu, Michael Pomerantz, Prithiviraj Shanmugam, Matthew A. Davies, Lauren L. Taylor, and Jie Qiao
OM3B.5 Optical Fabrication and Testing (OF&T) 2017

Subsurface Damage in Optically Worked Glass

Robert E. Parks
SMC1 Science of Optical Finishing (SCIOF) 1990

Non-Destructive Estimation of Subsurface Glass Damage Using Fluorescent Confocal Microscopy

Warren E. Smith, Thu-Huong Bui, Arne Lindquist, and Stephen D. Jacobs
WB12 Optical Fabrication and Testing (OF&T) 1992

Previous Article Next Article