Computer Controlled Spectrophotometer Measuring Reflectance and Transmittance Under Various Angles of Incidence

Eckart K. Hussmann; Hans J. Becker

doi:10.1364/OIC.1984.WA6

Third Topical Meeting on Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1984),
paper WA6
•https://doi.org/10.1364/OIC.1984.WA6

Computer Controlled Spectrophotometer Measuring Reflectance and Transmittance Under Various Angles of Incidence

Eckart K. Hussmann and Hans J. Becker

Optical Interference Coatings 1984

Monterey, California United States
17–19 April 1984
ISBN:

From the session
Characterization of Thin Films I (WA)

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E. K. Hussmann and H. J. Becker, "Computer Controlled Spectrophotometer Measuring Reflectance and Transmittance Under Various Angles of Incidence," in Third Topical Meeting on Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1984), paper WA6.

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Abstract

A computer controlled filter spectrophotometer measures automatically reflectance and transmittance of interference coatings under various angles of incidence. Their properties can be evaluated.

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