Optical Characterization of a Silver Film in Presence of a Dielectric Layer Using the ATR Technique

L.E. Regalado; I. Cruz-Encinas

doi:10.1364/OIC.1988.WC18

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1988),
paper WC18
•https://doi.org/10.1364/OIC.1988.WC18

Optical Characterization of a Silver Film in Presence of a Dielectric Layer Using the ATR Technique

L.E. Regalado and I. Cruz-Encinas

Optical Interference Coatings 1988

Tucson, Arizona United States
12–15 April 1988
ISBN:

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Optical Properties of Thin Films: 2 (WC)

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L. E. Regalado and I. Cruz-Encinas, "Optical Characterization of a Silver Film in Presence of a Dielectric Layer Using the ATR Technique," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1988), paper WC18.

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Abstract

Some methods for optical characterization of metals or absorbing films use dielectric overcoatings on the sample¹. However, a possible transition layer is not taken into account and it may cause changes in the actual optical constants to be determined.

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