Optical Characterization of Thin Films by Guided Waves

E. Pelletier

doi:10.1364/OIC.1988.WC2

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1988),
paper WC2
•https://doi.org/10.1364/OIC.1988.WC2

Optical Characterization of Thin Films by Guided Waves

E. Pelletier

Optical Interference Coatings 1988

Tucson, Arizona United States
12–15 April 1988
ISBN:

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Optical Properties of Thin Films: 2 (WC)

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E. Pelletier, "Optical Characterization of Thin Films by Guided Waves," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1988), paper WC2.

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Abstract

The study of guided waves in a thin layer allows a precise characterization of refractive index and thickness. Optical anisotropy can also be measured. We show how this technique can be applied to the characterization of a multilayer structure.

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