Abstract

Linear arrays of detectors and flat-panel displays have pixel-size elements of the order of 50 micrometers. Traditional spectrometers have beam dimensions much larger than this. Using available components, an instrument was designed to facilitate the making of optical measurements on small samples. Measurements of the quantum efficiency of amorphous silicon detector test pads of one square millimeter were made. The equipment is also capable of measuring the transmission and reflection spectra of small samples as well as the spectral output of small light source/filter combinations. To this end, the following components were utilized: 75 Watt xenon arc lamp with elliptical focusing mirror f/3.5 monochromator with adjustable entrance and exit slits stepper motor control of the wavelength scan of the monochromator one-to-one imaging of the exit slit to a beam-splitter/horizontal slit one-to-one imaging of the horizontal slit to the sample plane beam splitter/source-intensity detector fiber-optic sample-illumination system sample detector or calibrated detector optional detectors for transmission or reflection photocurrent to voltage amplifiers light chopper two lock-in amplifiers with ratioing capability IEEE 488 bus to computer computer control of stepper motor

© 1988 Optical Society of America