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Conferences > OIC > 1988 > WC > WC9

Determination of The Extinction Coefficient of Dielectric Thin Films from Spectrophotometric Measurements

J.P. Borgogno and E. Pelletier

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Abstract

Data obtained from reflectance and transmittance measurements are used to determine the extinction coefficient. We show that accuracy is limited by the substrate quality and by interface roughnesses of the layer.

© 1988 Optical Society of America

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