Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

From light scattering to the microstructure of thin film multilayers

Not Accessible

Your library or personal account may give you access


Light scattering from optical coatings takes its origins in the structural irregularities at interfaces and in the bulk of materials in thin film form. For this it carries information relative to the materials microstructure and may constitute a powerful tool for characterization. However this information is not easy to extract because of the complex relations that connect the scattered light to the microstructural parameters of the stack. This is one kind of inverse problem involving numerous parameters while we have only few equations given by the measurements. Our efforts have continued in Marseilles in this field and we will point out the level of understanding that has been reached.

© 1992 Optical Society of America

PDF Article
More Like This
Ellipsometry of light scattering from thin film multilayers

C. Deumié, H. Giovannini, G. Albrand, H. Akhouayri, and Claude Amra
WB15 Optical Interference Coatings (OIC) 1995

Relations between Light Scattering and Microstructure of Optical Thin Films

Angela Duparré
JWB1 Optical Interference Coatings (OIC) 1992

Observation of Rayleigh Scattering from Multilayer Dielectric Thin Films

C.K. Carniglia, B.J. Pond, J. Paul Black, and Steve E. Watkins
JWB4 Optical Interference Coatings (OIC) 1992

Select as filters

Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved