Abstract
The knowledge of variations in the reflectance in terms of the optical thickness in an all-dielectric multilayer coating simplifies the design and fabrication of a given optical device using thin film techniques. This variation has been defined as stability /1/ and has been demostrated to be inversely proportional to the partial derivative of the reflectance with respect to the phase change (∂R/∂ψ) or when this quantity vanishes, it is inversely proportional to the second derivative (∂2R/∂ψ2), following a second order development.
© 1992 Optical Society of America
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