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Conferences > OIC > 2010 > ThE > ThE8

Speckle histograms for a direct determination of cross-correlation laws in the light scattering process of multilayer optics

Myriam ZERRAD, Jacques SORRENTINI, and Claude AMRA

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Abstract

A statistical study of speckle patterns emitted by multilayer coatings is related to thin films microstructure. Cross-correlation coefficients between interface roughnesses are extracted from the speckle histogram behaviour. The extraction and experimental procedure are immediate.

© 2010 Optical Society of America

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