Immediate and one-point roughness measurements using spectrally shaped light

Xavier Buet; Myriam Zerrad; Michel Lequime; Gabriel Soriano; Claude Amra; Jean-Jacques-Narcisse Godeme; Jalal Fadili

doi:10.1364/OIC.2022.ThB.2

Optical Interference Coatings Conference (OIC) 2022
Technical Digest Series (Optica Publishing Group, 2022),
paper ThB.2
•https://doi.org/10.1364/OIC.2022.ThB.2

Immediate and one-point roughness measurements using spectrally shaped light

Xavier Buet, Myriam Zerrad, Michel Lequime, Gabriel Soriano, Claude Amra, Jean-Jacques-Narcisse Godeme, and Jalal Fadili

Optical Interference Coatings 2022

Whistler, British Columbia Canada
19–24 June 2022
ISBN: 978-1-957171-04-3

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Characterization II: New Tools and Methods (ThB)

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X. Buet, M. Zerrad, M. Lequime, G. Soriano, C. Amra, J. Godeme, and J. Fadili, "Immediate and one-point roughness measurements using spectrally shaped light," in Optical Interference Coatings Conference (OIC) 2022, R. Sargent and A. Sytchkova, eds., Technical Digest Series (Optica Publishing Group, 2022), paper ThB.2.

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Abstract

We operate a different approach to usual scattering measurements that is free of any mechanical movement. Scattering is measured at one direction. Illumination with a well-chosen wavelength spectrum immediately gives the roughness of the sample.

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