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Optical characterization of the impact of 100 keV protons on the optical properties of ZrO2 films prepared by ALD on fused silica substrates

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Abstract

ALD-grown ZrO2 films underwent irradiation by 100keV protons at various fluences. The induced structural damage modeled by SRIM was compared with the optical properties change characterized by ellipsometry, spectrophotometry and X-ray reflectivity.

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