Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Characterization of porous silicon using Terahertz differential time-domain spectroscopy

Not Accessible

Your library or personal account may give you access


Porous silicon (PS) films of different porosities are investigated using Terahertz Differential Time-Domain spectroscopy (THz-DTDS). Preliminary measurements indicate a power law type of behavior in the PS conductivity response.

© 2007 Optical Society of America

PDF Article
More Like This
Characterization of field-effect terahertz detectors by using terahertz time-domain spectroscopy

Hua Qin, Yao Yu, and Jiandong Sun
TuC2 International Symposium on Ultrafast Phenomena and Terahertz Waves (ISUPTW) 2018

Terahertz-Conductivity of Nano-Structured Gold Films

M. Walther, A. Thoman, C. Sherstan, D. G. Cooke, and F. A. Hegmann
WA4 Optical Terahertz Science and Technology (OTST) 2007

Terahertz time-domain spectroscopy technique for characterizing GaN thin film

Tsong-Ru Tsai, Shi-Jie Chen, Chih-Fu Chang, Tai-Yuan Lin, and Cheng-Chung Chi
JWD101 Frontiers in Optics (FiO) 2006


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access Optica Member Subscription

Select as filters

Select Topics Cancel
© Copyright 2022 | Optica Publishing Group. All Rights Reserved