Abstract

As the speed of electronic and optoelectronic devices moves into the picosecond time domain, optical techniques have the potential of an ever increasing importance in analyzing both device performance and the physical processes necessary for understanding high-speed operation. Optical methods have the advantage of ultrashort time resolution that exceeds all other high-speed measurement techniques. The state of ultrashort optical techniques is reviewed and the areas where these methods are likely to have an important impact are discussed.

© 1985 Optical Society of America