Abstract

The nonlinear component of the photoresponse of many optoelectronic devices can be used to determine their response speeds. The technique is of value because measurements are performed upon a single device rather than upon two interconnected devices. Transmission line problems, including bandwidth limitations and spurious signals due to reflections and radiated transients, are therefore avoided, and intrinsic response time measurements are possible on devices that cannot be paired with a high-speed photodetector in a large-bandwidth circuit.

© 1987 Optical Society of America