Abstract

We report a simple means of measuring device response times which is similar to cross-correlation techniques on linked pairs of photodetectors but which avoids the bandwidth limitations imposed by interconnecting transmission lines and largely eliminates the need for elaborate device mounting procedures [1,2]. Measurements are therefore possible on devices, such as those which must be mounted singly or those which are embedded in an integrated circuit without direct electrical access, whose intrinsic response speeds were previously not observable.

© 1986 Optical Society of America