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An Optically Strobed Sample and Hold Circuit*

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Abstract

Radiation damaged photoconductors have been shown to be useful devices for sampling repetitve electrical signals with time resolution to less than a PicoSecond1,2. However, the sampling of low repetition rate or single shot events with these photoconductors has not been possible due to the need for lock in detection methods to observe the sampled signal. In this paper, a radiation damaged photoconductor serves as the sampling element in a sample and hold circuit. It has been possible to sample single shot electrical signals with about a 10 picosecond aperture time. Once sampled the signal can be held for about 1 microsecond by an on-chip holding amplifier.

© 1987 Optical Society of America

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