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Conferences > PEO > 1989 > HSMT > HSMT31

120-GHz Active Wafer Probes for Picosecond Device Measurement

R. Majidi-Ahy and D. M. Bloom

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Abstract

We have developed frequency-multiplier and harmonic mixer active wafer probes for picosecond device measurements to 120 GHz. All-electronic 100 GHz on-wafer frequency-response measurements have been demonstrated using these probes.

© 1989 Optical Society of America

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