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Conferences > UEO > 1999 > UThC > UThC5

On-Wafer Testing of Circuits Through 220 GHz

Todd Gaier, Lorene Samoska, Charles Oleson, and Greg Boll

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Abstract

We have jointly developed the capability to perform on-wafer s-parameter and noise figure measurements through 220 GHz. S-parameter test sets have been developed covering full waveguide bands of 90-140 GHz (WR-08) and 140-220 GHz (WR-05). The test sets have been integrated with coplanar probes to allow accurate measurements on- wafer. We present the design and performance of the test sets and wafer probes. We also present calibration data as well as measurements of active circuits at frequencies as high as 215 GHz.

© 1999 Optical Society of America

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