Abstract

We describe experiments in which optoelectronic sampling techniques are used to investigate the transient response of integrated millimeter wave antenna elements. The internal device characteristics are analyzed by performing wide bandwidth time domain reflectometery measurements over a frequency span exceeding 200 GHz. In addition, we demonstrate a novel approach to measuring the transient far-field radiation patterns emitted from these devices. The far-field patterns in both the E and H Planes are observed to consist of single forward directed lobes which are shown to have a cosine-squared dependence.

© 1989 Optical Society of America