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Fabrication of Resonant Tunneling Diodes for Switching Applications

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Abstract

Resonant tunneling diodes have been fabricated in a microwave compatible process. Current densities in excess of 105 A/cm2 were achieved. Scattering matrix parameter measurements were performed to validate the equivalent circuit model used. Pulse forming structures were fabricated on chip and rise times from 6-10 ps were obtained.

© 1989 Optical Society of America

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