Abstract

For practical applications, such as the measurement of high speed electrical waveforms at internal nodes in integrated circuits, we proposed, for the first time in 1989¹⁾, Electro-Optic (E-0) sampling using a longitudinal probe and laser diode (LD) pulses. The longitudinal probe measures electric field just above the conductor and is free from crosstalk problems occurring in transverse probing. The laser diode is compact, inexpensive, reliable and easy to handle. Moreover, the laser pulses can be easily synchronized with the clock signals for the Device Under Test (DUT).

© 1991 Optical Society of America