New Scheme of Electrooptic Sampling by Probe Beam Polarization Modulation

Ryo Takahashi; Takeshi Kamiya

doi:10.1364/PEO.1991.WE4

Picosecond Electronics and Optoelectronics
Technical Digest Series (Optica Publishing Group, 1991),
paper WE4
•https://doi.org/10.1364/PEO.1991.WE4

New Scheme of Electrooptic Sampling by Probe Beam Polarization Modulation

Ryo Takahashi and Takeshi Kamiya

Picosecond Electronics and Optoelectronics 1991

Salt Lake City, Utah United States
13–15 March 1991
ISBN:

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R. Takahashi and T. Kamiya, "New Scheme of Electrooptic Sampling by Probe Beam Polarization Modulation," in Picosecond Electronics and Optoelectronics, Technical Digest Series (Optica Publishing Group, 1991), paper WE4.

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Abstract

Electrooptic (EO) sampling is a powerful technique to characterize very-high speed electrical waveforms in the time domain and to examine waveforms internal to Integrated circuits[1-6].

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