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Photorefractivity at 1.5 μm in CdTe:V

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Abstract

CdTe is the least studied of the photorefractive semiconductors known to date (GaAs, InP, and CdTe). This is somewhat surprising considering that the electrooptic coefficient of CdTe is almost four times larger than that of GaAs and InP. CdTe is also one of the most sensitive photorefractive media available. Its photorefractive figure of merit for sensitivity (index change per absorbed photon), n3r41r is 2.5 times that of GaAs.

© 1990 Optical Society of America

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